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Electronics & DAQ WG: radiation testing

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Wiki :

DAQ - EIC Project Detector Collaboration (bnl.gov)

Mailing list :

https://lists.bnl.gov/mailman/listinfo/eic-projdet-daq-l

https://lists.bnl.gov/mailman/admin/eic-projdet-daq-l

eic-projdet-daq-l@lists.bnl.gov 

Mattermost : join det1-daq channel 

  https://eic.cloud.mattermost.com/signup_user_complete/?id=i8gnmob4stdrpjfrezhegxs3ew

Digitization table link

https://docs.google.com/spreadsheets/d/1s8oXj36SqIh7TJeHFH89gQ_ayU1_SVEpWQNkx6sETKs/edit?usp=sharing

Project information link

https://wiki.bnl.gov/EPIC/index.php?title=Project_Information

Cables and service spreadsheets subdetectors

 

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Review June 10-11 2024: 

  • PDR Electronics and DAQ
  • FDR VTRX+, lpGBT

Preparation

  • Page Turns – 31 May 2024
  • Rehearsals – 4 June 2024
  • Final Documentation, Slides Uploads – 6 June 2024

Both WG meetings in the coming two weeks will be cancelled with our WG efforts diverted to the review preparation meetings. 

 

Radiation tests of the electronics - Tim, Gerad

~45MeV Proton beam to test combined effective-1MeV neutron and ionizing dose on COTS buck DCDC power supply. Survived 30% of the 10-year projection dose for worst locations (forward calorimeters).  

 

LTC7890 test: 

Gerad: The sampling frequency is relatively low, so the spikes could be more frequent. 

Gerad: other COTS components should pay attention too

 

Tonko: test CERN chips at UCD too? 

Tim/Gerad: good point, and can be done if the budget allows. Similar to existing boards (FCS)

Elke: can do the test again with preparation and planning. Each test is costly. IO has Co-60 source 

Elke: should consider bringing the radiation monitor as a cross-check

Tonko: consider adding linear regulators too

 

Tonko/Gerard: what after bPOL48V is down to 5V? 

Tim: to be followed up

 

Jeff: one DCDC each per board for FEB? 

Tim: one to few depending on the power demand.

 

Jin: what was TID from the proton beam in this test? 

Alex: TID for this beam test is about 10kRad

 

Jin: results from different parts seems to be similar to each other, which suggest the part-to-part variation of the same part number would be small? 

Tim: batch test would be the next step if a part was shown to be interesting. 

Jin: COTS parts could be used for other locations of lower radiation such as barrel and the backward directions. 

 

Jeff: could be interesting to learn from the CERN team on bias-unbiased and acute vs prolonged exposure 

Gerard: expect moderate difference. 

Elke: could be useful for a slower exposure test

Oleg: room-T self-annealing rate is very low 

There are minutes attached to this event. Show them.
    • 09:00 → 09:20
      Introduction 20m
      Speakers: Fernando Barbosa (JLab), Jeff Landgraf (Brookhaven National Laboratory), Dr Jin Huang (Brookhaven National Lab)
      Electronics&DAQ WG_23May2024.pptx
    • 09:20 → 09:50
      Radiation tests of the electronics 30m
      Speakers: Gerard Visser (Indiana University), Tim Camarda (BNL)
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