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John Smedley (BNL)12/10/2010, 11:3015 min. talkGo to contribution page
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Theodore Vecchione (LBL)12/10/2010, 11:4515 min. talkGo to contribution page
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Jean Jordan-Sweet (IBM)12/10/2010, 12:0020 min. talk/10 min. questionsGo to contribution page
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Jon Rameau (BNL)12/10/2010, 13:3020 min. talk/10 min. questionsGo to contribution page
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Luca Cultrera (Cornell Univ.)12/10/2010, 14:0020 min. talk/10 min. questions Overview of techniques, methods, limitations, etc. E.g. why some copper photocathode measurements report an emittance about x2 theory, while others basically agree with theory. Does this illuminate some error in thermal measurement?Go to contribution page
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Klaus Attenkofer (ANL)12/10/2010, 14:3020 min. talk/10 min. questionsGo to contribution page
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12/10/2010, 15:00
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Scott Chambers (PNNL)12/10/2010, 15:4530 min. talk/15 min. questionsGo to contribution page
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12/10/2010, 16:30Discussion charge: Proper measurement techniques of parameters relevant to accelerators; produce a list of measurement techniques that we can all agree on. Surface equipment/techniques available and desired for (to take most time). Photocathode growth and characterization. XPS, XRD, Topography, LEEM/PEEM, LEED/EBSD, SIMS, etc.--their application for understanding the structure and chemical...Go to contribution page
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