12–14 Oct 2010
Brookhaven National Laboratory
US/Eastern timezone

Session

Session 2 - Measurement of Relevant Cathode Parameters

12 Oct 2010, 11:30
Instrumentation Division, Bldg. 535B, Room A-122 (Brookhaven National Laboratory)

Instrumentation Division, Bldg. 535B, Room A-122

Brookhaven National Laboratory

20 N. Technology St. Upton, NY 11973

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  1. John Smedley (BNL)
    12/10/2010, 11:30
  2. Theodore Vecchione (LBL)
    12/10/2010, 11:45
  3. Jean Jordan-Sweet (IBM)
    12/10/2010, 12:00
    20 min. talk/10 min. questions
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  4. Jon Rameau (BNL)
    12/10/2010, 13:30
    20 min. talk/10 min. questions
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  5. Luca Cultrera (Cornell Univ.)
    12/10/2010, 14:00
    20 min. talk/10 min. questions Overview of techniques, methods, limitations, etc. E.g. why some copper photocathode measurements report an emittance about x2 theory, while others basically agree with theory. Does this illuminate some error in thermal measurement?
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  6. Klaus Attenkofer (ANL)
    12/10/2010, 14:30
    20 min. talk/10 min. questions
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  7. 12/10/2010, 15:00
  8. Scott Chambers (PNNL)
    12/10/2010, 15:45
    30 min. talk/15 min. questions
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  9. 12/10/2010, 16:30
    Discussion charge: Proper measurement techniques of parameters relevant to accelerators; produce a list of measurement techniques that we can all agree on. Surface equipment/techniques available and desired for (to take most time). Photocathode growth and characterization. XPS, XRD, Topography, LEEM/PEEM, LEED/EBSD, SIMS, etc.--their application for understanding the structure and chemical...
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