dRICH meeting - Sensors
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US/Eastern
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- 08:00 → 08:30
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08:30
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08:40
Investigation of physical damages (fractures) on SiPM after annealing 10mSpeaker: Luigi Pio Rignanese
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08:40
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08:50
Comparison of commercial Hamamtsu SiPM with the new custom samples 10mSpeaker: Mr Riccardo Ricci (INFN Bologna)
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08:50
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09:00
SiPM annealing with a fluid-assisted system without thermal camera 10mSpeaker: Mr Rajesh Achari (INFN Bologna)
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09:00
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09:10
Considerations on the lifespan of SiPMs over the years of EIC operation 10mSpeaker: Roberto Preghenella (INFN Bologna)