dRICH meeting - Sensors
→
US/Eastern
-
- 1
-
2
Investigation of physical damages (fractures) on SiPM after annealingSpeaker: Luigi Pio Rignanese
-
3
Comparison of commercial Hamamtsu SiPM with the new custom samplesSpeaker: Mr Riccardo Ricci (INFN Bologna)
-
4
SiPM annealing with a fluid-assisted system without thermal cameraSpeaker: Mr Rajesh Achari (INFN Bologna)
-
5
Considerations on the lifespan of SiPMs over the years of EIC operationSpeaker: Roberto Preghenella (INFN Bologna)