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Description
[Tomoki/Yuko: Digital control test]
- Slide 9, the entry of chip#21 became zero because it picked up a wrong line out of 2 data lines to send data in the special digital control?
-- The entry won't go down to zero even selecting the wrong line.
- Did you check if any particular channel become hot in the hot chips?
- Currently the physics runs are taken with the original digital control parameter.
- Three unstable half entry chips appeared also in the recent physics runs.
-- We need to keep eyes on the unstable chips to apply special digital control parameter if necessary, but how to track them?
-- Online plots is not good for the purpose because it won't appear in the hit map plot, which requires more sophisticated way to apply threshold to see such half-entry chip.
-- Should be implemented in the offline QA plots?
-- Jaein recommended to analyze CDB TTree with some macro, rather than implementing in the offline QA plots.
- How to proceed to the next test for the digital control?
-- Wait for Tomoki's detail analysis on the data, then we will take physics run with an updated digital control parameter if we are pretty sure the special digital control doesn't affect good chips.
[Yuko: Hotmap for MC simulation]
- Do we have a plan to reproduce MC data for p+p again?
-- Ask Joe about it.
- Maybe better to prepare for the CDB TTree for the trigger mode also.
-- It is good to make CDBs for different run configurations, like streaming/trigger and beam crossing angle, but we need to talk with collaborator first, not to confuse people.
[Milan]
- In silde 6, variation 1 should be 100e^-4, not 200.
- What is the ADC threshold?
-- Cluster ADC sum should be consistent regardless of the diffusion radius if the ADC threshold cut is not applied.
-- On the other hand, the cluster phi size should be bigger is diffusion radius is bigger, if no threshold cut applied.
- Still the statistics of MC is 5000 events per point (each diffusion parameter).
-- Need to process more MC events to see the difference at higher cluster phi size region.
- Struggling with crushing issue during the MC data process.
-- Is this an issue recognized by the collaboration?
[Joseph]
- Joseph updated git for 1008 INTT run control script so that the default open time become 60.
-- You don't need to modify run.py to change open_time from 100 to 60 when you do the digital control run by checking out git main branch.
[Jaein]
- For BCO diff offline plots, use error bar as contamination in the previous/next BCO bin from the peak position.
- Recommend to use some simple macro to analyze CDB TTree file rather than having offline QA plots.
-- Send a sample macro to Tomoki so that he can quickly start analyzing chip-by-chip hot/cold plots.
-- Tomoki need to prepare some script to see the run-by-run trend of half entry issue to catch newly-arrived half entry chips.
-- Cluster ADC sum should be consistent regardless of the diffusion radius if the ADC threshold cut is not applied.
-- On the other hand, the cluster phi size should be bigger is diffusion radius is bigger, if no threshold cut applied.
- Still the statistics of MC is 5000 events per point (each diffusion parameter).
-- Need to process more MC events to see the difference at higher cluster phi size region.
- Struggling with crushing issue during the MC data process.
-- Is this an issue recognized by the collaboration?
[Joseph]
- Joseph updated git for 1008 INTT run control script so that the default open time become 60.
-- You don't need to modify run.py to change open_time from 100 to 60 when you do the digital control run by checking out git main branch.
[Jaein]
- For BCO diff offline plots, use error bar as contamination in the previous/next BCO bin from the peak position.
- Recommend to use some simple macro to analyze CDB TTree file rather than having offline QA plots.
-- Send a sample macro to Tomoki so that he can quickly start analyzing chip-by-chip hot/cold plots.
-- Tomoki need to prepare some script to see the run-by-run trend of half entry issue to catch newly-arrived half entry chips.
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