Discussion charge: Proper measurement techniques of parameters relevant to accelerators; produce a list of measurement techniques that we can all agree on. Surface equipment/techniques available and desired for (to take most time). Photocathode growth and characterization. XPS, XRD, Topography, LEEM/PEEM, LEED/EBSD, SIMS, etc.--their application for understanding the structure and chemical form of the photocathodes, both initially and as a post mortum analysis. Substrate effects. New deposition techniques, such as ALD, with a focus on how they could help us grow better/more precisely engineered photocathodes.
Product: Cathode recipe list