INTT Weekly meeting

Thursday 6 Nov 2025, 20:00 → 23:00 US/Eastern

Meeting URL 

https://riken-jp.zoom.us/j/92149923535?pwd=sbLcakxQeRQrch8dnJfJ8g1NiEdvKa.1

20:00 → 20:20 INTT chip saturation issue

Speaker: Shan-Yu Chen (National Central University)

INTT_20251107.pdf

[Shan-Yu: INTT chip saturation issue]

- Minus 5 bin means no hit in the next BCO.

- Chip saturation was also verified nothing to do with BCO interval.

- What is the goal of this analysis?

-- This analysis is almost done. The next step is to write a document, e.g APR.

- Can you remove saturated chip activity with zebra like hit pattern?

-- Removing such a event is extremely difficult. Also the fraction of such hit pattern is less than 1%, so it is minor issue.

- We should apply cut for Num of hits > ~70/chip according to Cheng-Wei's analysis.

 

20:20 → 20:40 DAC Scan using Au+Au collision data

Speaker: Cheng-Wei Shih (National Central University)

INTT_2025_11_06_DACScan.pdf

[Cheng-Wei: DAC scan using AuAu collisions data]

- DAC ranges for AuAu Run24 are same as those for the test beam data.

- Peak position will move a few ticks but not much depending on the uncertainty of the background estimation.

- It would be nice include this result into the barrel paper.

- The gain offset is written in the manual.

- Beam test 2019 is not included in the paper because some of the control parameters are unclear.

- Even if considering the difference of the bias voltage and depletion curve, the two results (beam test 2021 and Run24) are consistent each other.

20:40 → 21:00 RIKEN Accelerator Progress Report

Speaker: Yuko Sekiguchi (RIKEN)

20251106_INTT.pdf

[Yuko: APR]

- Send your title to INTT group by the end of Nov and assign a tutor to you.