Speaker
David Osterman
(Member@umass.edu)
Description
We present preliminary data from a laser-scanning microscopy-based technique for measuring 100µm-scale quasiparticle (QP) diffusion in superconducting Al films. QP are produced at a localized origin in the Al film using a focused 1550nm laser coupled to a single-mode optical fiber mounted on piezoelectric nanopositioners. The resulting QP propagation can then be monitored using a transition edge sensor (TES), and described using a simple diffusion model.
Primary authors
Prof.
Dafei Jin
(University of Notre Dame; Argonne National Laboratory)
David Osterman
(Member@umass.edu)
Dr
Xianjing Zhou
(Argonne National Laboratory)
Dr
Xinhao Li
(Argonne National Lab)
